Instruments & Technical Skills

Core experimental and analytical capabilities spanning synthetic materials chemistry, single-crystal growth, nanoscale lithography, synchrotron X-ray/EUV metrology, high-throughput screening, and scientific data analysis.

Nanopatterning & Thin-Film Fabrication

  • EUV Lithography
  • Photoresist Formulation
  • Dry & Wet Development
  • Solution-Phase Self-Assembly
  • Spin-Coating
  • Perovskite Solar Cell Fabrication

X-ray & EUV Metrology

  • GIWAXS
  • Single-Crystal XRD (SC-XRD)
  • Powder X-ray Diffraction (XRD)
  • X-ray Photoelectron Spectroscopy (XPS)
  • EUV Photoemission / Total Electron Yield (TEY)
  • Residual Gas Analysis (RGA)

Spectroscopy

  • Nuclear Magnetic Resonance (NMR)
  • Steady-State & Time-Resolved PL
  • UV-Visible-NIR (UV-Vis)
  • Fourier-Transform Infrared (FTIR)

Microscopy & Surface Analysis

  • Atomic Force Microscopy (AFM)
  • Scanning Electron Microscopy (SEM)
  • Spectroscopic Ellipsometry
  • Stylus Profilometry
  • Contact Angle Goniometry

Synthesis & Single-Crystal Growth

  • Single-Crystal Growth (Vapor Diffusion & Slow Evaporation)
  • Glovebox & Schlenk Line Techniques
  • Hybrid Metal Halides
  • Conjugated & Redox-Active Polymers
  • Flash Chromatography
  • Soxhlet Extraction
  • Vacuum Distillation
  • Train Sublimation

Chromatography & Mass Spectrometry

  • UPLC-ESI-MS/MS
  • High-Performance Liquid Chromatography (HPLC)
  • Gel Permeation Chromatography (GPC)
  • Gas Chromatography–MS (GC-MS)

Thermal & Electrochemical Analysis

  • Thermogravimetric Analysis (TGA)
  • Differential Scanning Calorimetry (DSC)
  • Cyclic Voltammetry (CV)

High-Throughput & Automated Workflows

  • Hamilton Robotic Liquid Handling
  • Combinatorial Spin-Coating
  • High-Throughput PL & Optical Screening
  • Automated 96-Well SPE
  • Synchrotron Metrology Workflows

Data Analysis & Software

  • Python
  • MATLAB
  • Dimensionality Reduction (UMAP, PCA)
  • JMP Statistical Software
  • OriginLab
  • AB Sciex Analyst & MultiQuant
  • MestReNova